Khoo, Voon Ching (2014) A case study on the effectiveness of Multi-sites test handler to improve of Production Output. IOSR Journal of engineering (IOSRJEN), 4 (4). pp. 47-59. ISSN 2278-8719
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Abstract
The conventional method allows testing of only one chip at a time (single-site testing). However, due to advancements in testing procedures, current test technologies are able to conduct dual-sites testing, quad-sites testing, octal-sites testing, 16-sites testing, 32-sites testing, and so on. In line with this, the multi-site testing approach is a method that increases the number of chips that can be tested in a single touch-up. This method allows more chips to be tested per hour, thus improving the testing throughput. In this research the author take the initiative to develop a multi-sites throughput model to investigate the effectiveness of multi-site testing approach on improving the testing throughput. In the case study, five multi-site configurations were applied. These configurations were single-site, quad-sites, octal-sites, ×16-sites, and ×32-sites. A hypothesis was analyzed by using one-way ANOVA and Post Hoc Test.
Item Type: | Journal |
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Uncontrolled Keywords: | multi-site, test handler, semiconductor testing, multi-sites testing model |
Subjects: | T Technology > T Technology (General) |
Divisions: | School of Graduate Studies |
Depositing User: | Aida Rashidah Maajis |
Date Deposited: | 24 Jun 2019 01:56 |
Last Modified: | 24 Jun 2019 01:56 |
URI: | http://ur.aeu.edu.my/id/eprint/512 |
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